Product:

Single crystal YVO4 wafer

Purity:

> 99.99%

Material property:

Crystal structure:             Tetragonal

Lattice constant:              a = 7.12 Å, c = 6.29 Å

Density:                             4.22 g/cm3

Melting point:                  1825 °C

Mohs Hardness:               5

Thermal Expansion Coefficient:  4.43 × 10⁻⁶ /a; 11.37 × 10⁻⁶ /c

Transmission Range:      0.4 – 5 µm

Thermal Conductivity:   A-axis = 5.32 W/(m·K); C-axis = 5.10 W/(m·K)

Thermo-Optic Coefficient: dnₐ/dT = 8.5 × 10⁻⁶ /K; dnc/dT = 3.0 × 10⁻⁶ /K

Refractive Indices (at birefringence 45° angle ρ):

            – No = 1.9929, ne = 2.2154, Δn = 0.2225, ρ = 6.04° at 0.63 µm

            – No = 1.9500, ne = 2.1554, Δn = 0.2054, ρ = 5.72° at 1.30 µm

            – No = 1.9447, ne = 2.1486, Δn = 0.2039, ρ = 5.69° at 1.55 µm

Growth method:               CZ

Dimension:

• 5 × 5 mm

• 5 × 10 mm

• 10 × 10 mm

• 20 × 20 mm

• φ1″ x 0.5mm
• φ2″ x 0.5mm
• Other sizes customizable

Thickness:

• 0.1 mm

• 0.5 mm

• 1.0 mm

• 2.0 mm

• Other sizes customizable

Orientation:

• <100> ± 0.5°

• <001> ± 0.5°

• <110> ± 0.5°

• other off-angle

Polishing:

• Fine ground

• Single side epi-polished

• double side epi-polished

Surface roughness:

< 0.5 nm