YSZ Wafer (Yttria-Stabilized Zirconia Wafer)

High-temperature stable oxide substrate for epitaxy, buffer layers, and solid oxide fuel cells

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Description

🔷 Overview

YSZ (Yttria-Stabilized Zirconia) wafer is a cubic single crystal substrate formed by doping zirconia (ZrO₂) with yttria (Y₂O₃), which stabilizes its crystal structure at room temperature.

It is widely used as a substrate and buffer layer for epitaxial oxide thin films, as well as a solid electrolyte in high-temperature applications such as solid oxide fuel cells (SOFC).

With excellent thermal stability, chemical resistance, and mechanical strength, YSZ is a versatile and cost-effective material for advanced research and industrial applications.

 

🔷 Key Features

• Stable cubic crystal structure (yttria-stabilized)

• Excellent thermal and chemical stability

• High hardness (≈8–8.5 Mohs)

• Good oxygen ion conductivity (high-temperature applications)

• Ideal as buffer layer for epitaxial growth on Si and other substrates

• Epi-ready surface with low roughness

 

🔷 Specifications

Product: Yttria stabilized ziconia (YSZ) wafer
Material: ZrO2 : Y2O3 = 92 : 8 mol%
Material property: Crystal structure: Cubic
Lattice constant: a = 5.125 Å
Density: 5.80 g/cm3
Melting point: 2500 °C
Growth Method: Flux Technique
Dimension:

• 5 × 5 × 0.5 mm

• 10 × 10 × 0.5 mm

• Other sizes customizable

Orientation: <100> / <110> / <111>
Polishing: Single side / double side epi-polished                                                       
Surface roughness: < 0.5 nm

 

 

🔷 Applications

• Buffer layer for epitaxial growth (e.g. on Si substrates)

• Oxide thin film deposition (PLD / MBE / sputtering)

• Solid oxide fuel cells (SOFC electrolyte)

• Thermal barrier coatings and high-temperature devices

• Optical and infrared applications

 

 

🔷 Customization Options

• Y₂O₃ doping concentration (typically 8–13 mol%)

• Orientation and off-cut

• Thickness and dimension customization

• Double-side polishing (DSP) available

• Epi-ready surface treatment