Description
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Test Method: |
TEM (Transmission Electron Microscopy) |
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Equipment: |
JEOL 2100F / Tecnai F30 / Tecnai T12 |
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Magnification: |
Up to 1.5 million |
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Voltage: |
120 / 200 / 300 kV |
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Applications: |
• Morphological characterizations • Atomic scale observations and analyses • Compositional analyses |
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Test Modes: |
Low magnification image • Default basic services • Magnifications below 500 K HRTEM • High-resolution image (atomic-resolution) TEM-EDS • EDS (Energy-Dispersive Spectroscopy) • Point-detection / Line scanning / Mapping S-TEM • Scanning Transmission Electron Microscopy |
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Test Time: |
• 7 Working Days |
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Useful Links: |
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