SEM Testing Services
Price
$190.00
From millimeter to nanometer scale morphology and chemical composition characterization
Description
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Test Method: |
SEM (Scanning Electron Microscope) |
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Equipment: |
JEOL 7600F / Hitachi S4800 |
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Magnification: |
Up to 500 K |
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Voltage: |
0.5 – 30 kV |
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Applications: |
• Morphological characterization • EDS for microscale element composition analyses |
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Test Modes: |
Normal Imaging: • Default in SEI mode (Secondary Electron Imaging) • BEI mode available (Backscatter Electron Imaging) SEM-EDS • EDS: Energy-Dispersive Spectroscopy • Microscale compositional analysis • Point Detection / Line Scanning / Mapping |
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Test Time: |
• 7 Working Days |
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Useful Links: |
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