Test Method:

XRD (X-ray Diffraction)

Equipment:

Bruker D8 Advance / Ultima IV

Applications:

• Crystallographic analyses

• Quantitative compositional analyses

• In situ observation of crystal phase changes at high temperature

Test Modes:

Normal Scanning:

• Scanning Mode: θ - 2θ

• 2θ Angle Range: 10° - 90° (or as required)

Small Angle Scanning:

• Scanning Mode: θ - 2θ

• 2θ Angle Range: 3° - 10° (or as required)

Grazing Incidence Diffraction (GID, GIXRD):

• Scanning Mode: α - 2θ

• α is the fixed incidence angle: 1° (or as required)

• 2θ Angle Range: 10° - 90° (or as required)

X-Ray Reflectivity (XRR):

• Analyses of film thickness, roughness, etc

High Temperature Scanning:

• Scanning Mode: θ - 2θ

• 2θ Angle Range: 10° - 90° (or as required)

• Substrate Temperature: RT - 2000 °C

Test Time:

• 7 Working Days

Useful Links:

• XRD on Wikipedia

• GID / GIXRD on Wikipedia