Test Method:

SEM (Scanning Electron Microscope)

Equipment:

JEOL 7600F / Hitachi S4800

Magnification:

Up to 500 K

Voltage:

0.5 – 30 kV

Applications:

• Morphological characterization

• EDS for microscale element composition analyses

Test Modes:

Normal Imaging:

• Default in SEI mode (Secondary Electron Imaging)

• BEI mode available (Backscatter Electron Imaging)

SEM-EDS

• EDS: Energy-Dispersive Spectroscopy

• Microscale compositional analysis

• Point Detection / Line Scanning / Mapping

Test Time:

• 7 Working Days

Useful Links:

• SEM on Wikipedia

• EDS on Wikipedia